Review




Structured Review

Tektronix inc 2400 current–voltage source meter
2400 Current–Voltage Source Meter, supplied by Tektronix inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2400+voltage+source+meter/2400+voltage+source/pmc10876045-75-8-7
Average 90 stars, based on 1 article reviews
2400 current–voltage source meter - by Bioz Stars, 2026-11
90/100 stars

Images

Related Articles

other:

Article Title: Effect of grain boundaries on charge transport in CVD-grown bilayer graphene
Article Snippet: Accepted Manuscript Effect of grain boundaries on charge transport in CVD-grown bilayer graphene Jun Wu, Yongchao Li, Danfeng Pan, Chenghuan Jiang, Chen Jin, Fengqi Song, Guanghou Wang, Jianguo Wan PII: S0008-6223(19)30252-0 DOI: https://doi.org/10.1016/j.carbon.2019.03.029 Reference: CARBON 14034 To appear in: Carbon Received Date: 15 November 2018 Revised Date: 26 February 2019 Accepted Date: 11 March 2019 Please cite this article as: J. Wu, Y. Li, D. Pan, C. Jiang, C. Jin, F. Song, G. Wang, J. Wan, Effect of grain boundaries on charge transport in CVD-grown bilayer graphene, Carbon (2019), doi: https:// doi.org/10.1016/j.carbon.2019.03.029.. This is a PDF file of an unedited manuscript that has been accepted for publication.. As a service to our customers we are providing this early version of the manuscript.

Article Title: InGaN micro-light-emitting diodes monolithically grown on Si: achieving ultra-stable operation through polarization and strain engineering
Article Snippet: The I-V characteristics were measured using a Keithley 2400 voltage source meter.

Article Title: Gallium vacancy formation in oxygen annealed β-Ga2O3
Article Snippet: In this study, the formation and character of gallium vacancies (VGa) and their complexes in near surface and bulk regions of single crystal β-Ga2O3 were explored using unintentionally doped single crystals grown by the Czochralski method.. As-grown and O2 annealed (up to 1550 °C) samples were investigated using positron annihilation spectroscopy (PAS) to study the top 0.05–6 μm, and also current– voltage measurements and infrared (IR) spectroscopy, with hydrogenated samples to probe VGa, to study the bulk.. After annealing in O2 > 1000 °C, the β-Ga2O3 resistivity begins increasing, up to ∼10Ω cm for 1550 °C treatment, with the top 0.5 mm being many orders of magnitude more resistive.

Article Title: Influence of Au9+ ion irradiation on the properties of electrodeposited CdTe thin films
Article Snippet: The modification of the properties of II-VI group semiconducting nanomaterials with a high energy ion beam is an imminent field of interest presently.. This work presents the impact of energetic (120MeV) gold (Au9+) ions on electrochemically deposited thin films of cadmium telluride (CdTe).. The substrate chosen for the deposition of thin films is indium tin oxide (ITO)-coated glass substrate.

Article Title: InGaN micro-light-emitting diodes monolithically grown on Si: achieving ultra-stable operation through polarization and strain engineering.
Article Snippet: The I-V characteristics were measured using a Keithley 2400 voltage source meter.

Article Title: Microstructure and Resistive Switching Behavior of Amorphous Pr0.7Ca0.3MnO3 Films Grown under Various Oxygen Pressures
Article Snippet: Amorphous Pr0.7Ca0.3MnO3(APCMO) films grown on a Pt electrode under an oxygen pressure(OP) of 5 mTorr showed a dense microstructure with a smooth surface but bipolar switching behavior was not observed in this film.. Porosity and surface roughness increased with increasing OP and a typical bipolar switching behavior was observed in the APCMO films grown under 100 and 200 mTorr OP.. The resistance of these APCMO films decreased with increasing device area in both lowand high-resistance states.

Article Title: Synchronous Growth of High-Quality Bilayer Bernal Graphene: From Hexagonal Single-Crystal Domains to Wafer-Scale Homogeneous Films
Article Snippet: The precise control of the domain structure, layer thickness, and stacking order of graphene has attracted intense interest because of its great potential for nanoelectronics applications.. Much effort has been devoted to synthesize semiconducting Bernal (AB)-stacked bilayer graphene because of its tunable band structure and electronic properties that are unavailable to single-layer graphene.. However, fast growth of large-scale bilayer graphene sheets with a high AB-stacking ratio and high mobility on copper poses a tremendous challenge, which has to overcome the self-limiting effect.

Software:

Article Title: In−situ monitoring Poly(3-hexylthiophene) nanowire formation and shape evolution in solution via small angle neutron scattering
Article Snippet: The instrument was operated in tapping mode with Bruker TESPA tapping mode cantilevers, with a nominal spring constant of N m42 / and a nominal resonant frequency of kHz320 . .. I–V curves were obtained with software developed in LabView and a Keithley 2400 voltage source meter. ..



Similar Products

90
Keysight Technologies 2400 dc voltage source meter
2400 Dc Voltage Source Meter, supplied by Keysight Technologies, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2400+voltage+source+meter/2400+dc+voltage+source+meter/pmc11737322-83-22-21
Average 90 stars, based on 1 article reviews
2400 dc voltage source meter - by Bioz Stars, 2026-11
90/100 stars
  Buy from Supplier

90
Keysight Technologies dc voltage source meter keysight 2400
Dc Voltage Source Meter Keysight 2400, supplied by Keysight Technologies, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2400+voltage+source+meter/dc+voltage+source+meter+keysight+2400/pm39822729-87-22-21
Average 90 stars, based on 1 article reviews
dc voltage source meter keysight 2400 - by Bioz Stars, 2026-11
90/100 stars
  Buy from Supplier

90
Tektronix inc 2400 current–voltage source meter
2400 Current–Voltage Source Meter, supplied by Tektronix inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2400+voltage+source+meter/2400+voltage+source/pmc10876045-75-8-7
Average 90 stars, based on 1 article reviews
2400 current–voltage source meter - by Bioz Stars, 2026-11
90/100 stars
  Buy from Supplier

90
Tektronix inc 2400 voltage/current source meter
2400 Voltage/Current Source Meter, supplied by Tektronix inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2400+voltage+source+meter/2400+source+meter/pmc10142452-66-9-8
Average 90 stars, based on 1 article reviews
2400 voltage/current source meter - by Bioz Stars, 2026-11
90/100 stars
  Buy from Supplier

90
Tektronix inc 2400 voltage source meter
2400 Voltage Source Meter, supplied by Tektronix inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2400+voltage+source+meter/2400+voltage+source/pmc09550839-145-8-7
Average 90 stars, based on 1 article reviews
2400 voltage source meter - by Bioz Stars, 2026-11
90/100 stars
  Buy from Supplier

90
Tektronix inc 2400 voltage current source meter
2400 Voltage Current Source Meter, supplied by Tektronix inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/2400+voltage+source+meter/2400+voltage+source/pmc08520554-50-18-17
Average 90 stars, based on 1 article reviews
2400 voltage current source meter - by Bioz Stars, 2026-11
90/100 stars
  Buy from Supplier

Image Search Results